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Volumn 3154, Issue , 1997, Pages 27-38

Production and characterization of x-ray speckle at sector 8 of the advanced photon source

Author keywords

Aerogel; Coherent x ray diffraction; Small angle x ray scattering; Speckle

Indexed keywords

AEROGELS; CORRELATION METHODS; OPTIMIZATION; PHOTONS; VECTORS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING; X RAY SPECTROMETERS;

EID: 0031300610     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.293368     Document Type: Conference Paper
Times cited : (4)

References (25)
  • 15
    • 0010018684 scopus 로고    scopus 로고
    • Amptek Inc., Bedford, Massachusetts, USA
  • 16
    • 0010056053 scopus 로고    scopus 로고
    • Princeton Instruments Inc., Trenton, New Jersey, USA


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.