1/f noise and microstructure in thin aluminum lines

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 415-418

  Ochs, E ^a   van den Homberg, M J C ^a   Alkemade, P F A ^a   Armbruster, K ^a   Seeger, A ^a   Stoll, H ^a   Verbruggen, A H ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; SPECTROMETERS; THERMAL NOISE;

HIGHLY SENSITIVE NOISE SPECTROMETERS; THIN ALUMINUM LINES;

ALUMINUM;

EID: 0031295476     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)