Statistics of random telegraph noise in sub-μm MOSFETs

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 195-200

  Mueller, H H ^a   Schulz, M ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT DENSITY; MOSFET DEVICES; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS;

RANDOM TELEGRAPH SIGNAL (RTS);

SPURIOUS SIGNAL NOISE;

EID: 0031295433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)