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Volumn 7, Issue , 1997, Pages 561-566

Image features from one-dimensional wavelet transforms for defect detection

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; INSPECTION; LEARNING SYSTEMS; NEURAL NETWORKS; OBJECT RECOGNITION; ONE DIMENSIONAL; SCANNING; WAVELET TRANSFORMS; WOOD;

EID: 0031295189     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.