Study of laser destruction for optoelectronic device and semiconductor material

Guangdianzi Jiguang/Journal of Optoelectronics Laser

Volumn 8, Issue 6, 1997, Pages 487-490

  Ni, Xiaowu ^a   Shen, Zhonghua ^a   Lu, Jian ^a  

^a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; HIGH ENERGY LASERS; OPTOELECTRONIC DEVICES; SEMICONDUCTOR MATERIALS;

HIGH POWER LASER EFFECTS; LASER DESTROYING;

LASER BEAM EFFECTS;

EID: 0031293663     PISSN: 10050086     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)