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Volumn 3197, Issue , 1997, Pages 217-222
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High-precision distance microscopy of 3D-nanostructures by a spatially modulated excitation fluorescence microscope
a a a a |
Author keywords
Fluorescence light microscopy; Precision distance measurements; Precision localization; Spatial resolution; Spatially modulated excitation fluorescence microscopy; Standing wave field microscopy
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Indexed keywords
DISTANCE MEASUREMENT;
GENES;
IMAGE ANALYSIS;
LIGHT REFRACTION;
MICROSCOPIC EXAMINATION;
NANOSTRUCTURED MATERIALS;
OPTICAL RESOLVING POWER;
OPTICAL SYSTEMS;
SPATIALLY MODULATED EXCITATION (SME);
FLUORESCENCE;
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EID: 0031289976
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.297969 Document Type: Conference Paper |
Times cited : (12)
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References (22)
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