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Volumn 3197, Issue , 1997, Pages 217-222

High-precision distance microscopy of 3D-nanostructures by a spatially modulated excitation fluorescence microscope

Author keywords

Fluorescence light microscopy; Precision distance measurements; Precision localization; Spatial resolution; Spatially modulated excitation fluorescence microscopy; Standing wave field microscopy

Indexed keywords

DISTANCE MEASUREMENT; GENES; IMAGE ANALYSIS; LIGHT REFRACTION; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS;

EID: 0031289976     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.297969     Document Type: Conference Paper
Times cited : (12)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.