Hard X-ray calibration facility design for JEM-X detector onboard of INTEGRAL

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3114, Issue , 1997, Pages 404-411

  Pareschi, Giovanni ^a   Frontera, Filippo ^a   Pelliciari, Carlo ^a   Zavattini, Guido ^a   Carassiti, Vittore ^a   Evangelisti, Federico ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Astronomical Instrumentation; Hard X rays; X ray Calibrations; X ray detectors

Indexed keywords

ASTRONOMY; BAND STRUCTURE; CALIBRATION; GAMMA RAYS; LIGHT REFLECTION; MONOCHROMATORS; X RAYS;

X-RAY CALIBRATION;

RADIATION DETECTORS;

EID: 0031289026     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.283783     Document Type: Conference Paper

References (16)

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7. JEM-X detector
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13. X-ray monochromators and mirrors
14. X-ray characterization of lapped surfaces of Si and Ge single crystals at 33.17 keV