Measurement based depth-of-focus

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2982, Issue , 1997, Pages 476-484

  Ellenberger, Stephanie L ^a   Young, Ian T ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Depth of focus; Optical transfer function; Quantitative microscopy

Indexed keywords

CYTOLOGY; ELECTROMAGNETIC WAVE DIFFRACTION; FLUORESCENCE; GENETIC ENGINEERING; LIGHT ABSORPTION; MICROSCOPIC EXAMINATION; OPTICAL TRANSFER FUNCTION;

QUANTITATIVE MICROSCOPY;

IMAGING TECHNIQUES;

EID: 0031288839     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.273648     Document Type: Conference Paper

References (7)

1. Depth-of-focus in microscopy
2. The frequency response of a defocused optical system
3. Autofocusing in microscopy based on the OTF and sampling