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Proceedings of SPIE - The International Society for Optical Engineering
Volumn 3084, Issue , 1997, Pages 91-101
Calibration and non-uniformity correction of MICOM's diode laser based infrared scene projector
Author keywords

Diode lasers; FPA testing; Hardware in the loop; Infrared; Scene Projection; Simulation
Indexed keywords

ARRAYS; COMPUTER HARDWARE; INFRARED DEVICES; OPTICAL SENSORS; OPTICAL TESTING; PROJECTION SYSTEMS; SCANNING; SEMICONDUCTOR LASERS;
EID: 0031288832     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.280973     Document Type: Conference Paper
Times cited : (13)
References (5)
  • 1
    • 0005320264 scopus 로고
    • Diode laser arrays for dynamic infrared scene projection
    • Characterization, Propagation, and Simulation of Sources and Backgrounds III, Wendell R. Watkins, Dieter Clement, Editors
    • (1993) Proc. SPIE , vol.1967 , pp. 77-88
    • Beasley, D.B.1    Cooper, J.B.2
  • 3
    • 0029238509 scopus 로고
    • Optical design of a diode laser based dynamic IR scene projector
    • Targets and Backgrounds: Characterization and Representation, Wendell R. Watkins, Dieter Clement, Editors
    • (1995) Proc. SPIE , vol.2469 , pp. 146-156
    • Cooper, J.B.1    Beasley, D.B.2
  • 4
    • 0029749295 scopus 로고    scopus 로고
    • Performance capabilities and utilization of MICOM's diode laser based infrared scene projector technology
    • Technologies for Synthetic Environments: Hardware-in-the-Loop Testing, Robert L. Murrer, Jr., Editor
    • (1996) Proc. SPIE , vol.2741 , pp. 110-118
    • Beasley, D.B.1    Cooper, J.B.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.