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Volumn 32, Issue 1-2, 1997, Pages 107-121
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Taking the good with the bad: How migration to an integrated library system can affect serials work flow
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031288171
PISSN: 0361526X
EISSN: 15411095
Source Type: Journal
DOI: 10.1300/J123v32n01_08 Document Type: Article |
Times cited : (2)
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References (2)
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