Grating interferometry with a semiconductor light source

Applied Optics

Volumn 36, Issue 31, 1997, Pages 8116-8120

  Koziowska, Anna ^a   Kujawińska, Maigorzata ^a   Gorecki, Christophe ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

Grating interferometry; Laser diodes; Moir interferometry; Spectral properties; Wavelength modulation

Indexed keywords

CALCULATIONS; CAMERAS; CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; FIBER OPTICS; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT MODULATION; LIGHT SOURCES; SEMICONDUCTOR LASERS;

GRATING INTERFEROMETRY; INJECTION CURRENT INDUCED MODULATION; SEMICONDUCTOR LIGHT SOURCE;

INTERFEROMETERS;

EID: 0031280996     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008116     Document Type: Article

References (16)

1. D. Post, B. Han, and P. Ifju, High Sensitivity Moire. Experimental Analysis for Mechanics and Materials(SpringerVerlag, New York, 1994).
2. M. Kujawinska, “Automatic moire interferometry for optical local and global analysis of transient phenomena, ” inAdvances in Electronic Packaging, T. R. Hsu, A. Bar-Cohen, and W. Nakayama, eds. (American Society of Mechanical Engineers, New York, 1995), Vol. 10-2, pp. 1179-1185.
3. M. Kujawinska and L. Salbut, “New trends in instrumentation and application of automated grating interferometry, ” inInterferometry VII: Applications, R. J. Pryputniewicz, G. M. Brown, and W. P. Juptner, eds., Proc. SPIE2545, 2-16 (1995).
4. R. Czarnek, “High sensitivity moire interferometry with compact achromatic interferometer, ” Opt. Lasers Eng.13, 99-115 (1990).
5. E. Udd, Fiber Optic Sensors(Wiley, New York, 1991).
6. J. Kato, I. Yamaguchi, and Q. Ping, “Automatic deformation analysis by a TV speckle interferometer using a laser diode, ” Appl. Opt.32, 77-83 (1993).
7. P. Drabarek, G. Kiihnle, and M. van Keulen, “Laser diode for interferometric applications, ” inInterferometry’94: New Techniques and Analysis in Optical Measurements, M. Kujawinska and K. Patorski, eds., Proc. SPIE2340, 346-355 (1994).
8. Y. Ning, K. T. V. Grattan, B. T. Meggitt, and A. W. Palmer, “Characteristics of laser diodes for interferometric use, ” Appl. Opt.28, 3657-3661 (1989).
9. A. Dandridge and L. Goldberg, “Current-induced frequency modulation in diode lasers, ” Electron. Lett.18, 302-304 (1982).
10. H. Atcha and R. P. Tatam, “Heterodyning of fibre optic electronic speckle pattern interferometers using laser diode wavelength modulation, ” Meas. Sci. Technol.5, 704-709 (1994).
11. P. Hariharan, “Phase-stepping interferometry with laser diodes: effect of changes in laser power with output wavelength, ” Appl. Opt.28, 27-29 (1989).
12. A. Kozlowska, “Fiber optic grating interferometer for in-plane displacement measurement, ” inInterferometry’94: Interferometric Fiber Sensing, E. Udd and R. P. Tatam, eds., Proc. SPIE2341, 124-131 (1994).
13. F. Dai, J. McKelvie, and D. Post, “An interpretation of moire interferometry from wavefront interference theory, ” Opt. Lasers Eng.12, 101-118 (1990).
14. M. Born and E. Wolf, Principles of Optics(Pergamon, New York, 1975), pp. 491-554.
15. C. H. Henry, “Theory of the linewidth of semiconductor lasers, ” IEEE J. Quantum Electron.QE-18, 259-264 (1982).
16. A. Kozlowska, M. Kujawinska, and C. Gorecki, “Remote control in-plane displacement measurement system, ” inOptical Inspection and Micromeasurements, C. Gorecki, ed., Proc. SPIE2782, 243-249 (1996).