-
1
-
-
0000835712
-
The reflection of electromagnetic waves from rough surface
-
H. Davies, “The reflection of electromagnetic waves from rough surface, ” Proc. Inst. Electr. Eng. 101, 209-214 (1954).
-
(1954)
Proc. Inst. Electr. Eng.
, vol.101
, pp. 209-214
-
-
Davies, H.1
-
2
-
-
85010131484
-
Relation between surface roughness and specular reflectance at normal incidence
-
H. E. Bennett and J. O. Porteus, “Relation between surface roughness and specular reflectance at normal incidence, ” J. Opt. Soc. Am. 51, 123-129 (1961).
-
(1961)
J. Opt. Soc. Am.
, vol.51
, pp. 123-129
-
-
Bennett, H.E.1
Porteus, J.O.2
-
4
-
-
0018443213
-
Relationship between surface scattering and microtopographic features
-
E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features, ” Opt. Eng. 18, 125-136 (1979).
-
(1979)
Opt. Eng.
, vol.18
, pp. 125-136
-
-
Church, E.L.1
Jenkinson, H.A.2
Zavada, J.M.3
-
6
-
-
84983577984
-
-
Vol. 10.05 of ASTM Standards, ASTM Doc. No. F1048-87 (American Society for Testing Materials, Philadelphia, Pa
-
J. C. Stover, Standard Test Method for Measuring the Effective Surface Roughness ofOptical Components by Total Integrated Scattering, Vol. 10.05 of ASTM Standards, ASTM Doc. No. F1048-87 (American Society for Testing Materials, Philadelphia, Pa., 1996), pp. 418-421.
-
(1996)
Standard Test Method for Measuring the Effective Surface Roughness Ofoptical Components by Total Integrated Scattering
, pp. 418-421
-
-
Stover, J.C.1
-
7
-
-
0022867836
-
Total integrated scatter measurement system for quality assessment of coatings on optical surfaces
-
J. R. Jacobson, Ed., Proc. SPIE
-
L. Mattsson, “Total integrated scatter measurement system for quality assessment of coatings on optical surfaces, ” in Thin Film Technologies, J. R. Jacobson, ed., Proc. SPIE 652, 264-271 (1986).
-
(1986)
Thin Film Technologies
, vol.652
, pp. 264-271
-
-
Mattsson, L.1
-
8
-
-
18444410700
-
A practical total integrated scatterometer
-
J. M. Bennett, Ed., Proc. SPIE
-
J. M. Guerra, “A practical total integrated scatterometer, ” in Surface Measurement and Characterization, J. M. Bennett, ed., Proc. SPIE 1009, 146-154 (1988).
-
(1988)
Surface Measurement and Characterization
, vol.1009
, pp. 146-154
-
-
Guerra, J.M.1
-
9
-
-
0028368633
-
Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region
-
D. Ronnow and E. Veszelei, “Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region, ” Rev. Sci. Instrum. 65, 327-333 (1994).
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 327-333
-
-
Ronnow, D.1
Veszelei, E.2
-
10
-
-
84975655389
-
Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques
-
R. D. Jacobson, S. R. Wilson, G. A. Al-Jumaily, J. R. McNeil, J. M. Bennett, and L. Mattsson, “Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques, ” Appl. Opt. 31, 1426-1435 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 1426-1435
-
-
Jacobson, R.D.1
Wilson, S.R.2
Al-Jumaily, G.A.3
McNeil, J.R.4
Bennett, J.M.5
Mattsson, L.6
-
11
-
-
0003753856
-
Focusing properties of hemispherical and ellipsoidal mirror reflectometers
-
W. M. Brandenberg, “Focusing properties of hemispherical and ellipsoidal mirror reflectometers, ” J. Opt. Soc. Am. 54, 1235-1237 (1964).
-
(1964)
J. Opt. Soc. Am.
, vol.54
, pp. 1235-1237
-
-
Brandenberg, W.M.1
-
12
-
-
0001458859
-
Scanning scattering microscope for surface microtopography and defect imaging
-
J. Lorincik, D. Marton, R. L. King, and J. Fine, “Scanning scattering microscope for surface microtopography and defect imaging, ” J. Vac. Sci. Technol. B14, 2417-2423 (1996).
-
(1996)
J. Vac. Sci. Technol.
, vol.B14
, pp. 2417-2423
-
-
Lorincik, J.1
Marton, D.2
King, R.L.3
Fine, J.4
|