메뉴 건너뛰기




Volumn 36, Issue 31, 1997, Pages 8270-8274

Focusing properties of hemispherical mirrors for total integrating scattering instruments

Author keywords

Focusing; Hemispherical mirror; Total integrated scattering

Indexed keywords

CALCULATIONS; FOCUSING; HELIUM NEON LASERS; IMAGING TECHNIQUES; LASER BEAMS; LIGHT SCATTERING; PHOTODETECTORS; TRANSFER FUNCTIONS;

EID: 0031280787     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008270     Document Type: Article
Times cited : (15)

References (12)
  • 1
    • 0000835712 scopus 로고
    • The reflection of electromagnetic waves from rough surface
    • H. Davies, “The reflection of electromagnetic waves from rough surface, ” Proc. Inst. Electr. Eng. 101, 209-214 (1954).
    • (1954) Proc. Inst. Electr. Eng. , vol.101 , pp. 209-214
    • Davies, H.1
  • 2
    • 85010131484 scopus 로고
    • Relation between surface roughness and specular reflectance at normal incidence
    • H. E. Bennett and J. O. Porteus, “Relation between surface roughness and specular reflectance at normal incidence, ” J. Opt. Soc. Am. 51, 123-129 (1961).
    • (1961) J. Opt. Soc. Am. , vol.51 , pp. 123-129
    • Bennett, H.E.1    Porteus, J.O.2
  • 4
    • 0018443213 scopus 로고
    • Relationship between surface scattering and microtopographic features
    • E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features, ” Opt. Eng. 18, 125-136 (1979).
    • (1979) Opt. Eng. , vol.18 , pp. 125-136
    • Church, E.L.1    Jenkinson, H.A.2    Zavada, J.M.3
  • 7
    • 0022867836 scopus 로고
    • Total integrated scatter measurement system for quality assessment of coatings on optical surfaces
    • J. R. Jacobson, Ed., Proc. SPIE
    • L. Mattsson, “Total integrated scatter measurement system for quality assessment of coatings on optical surfaces, ” in Thin Film Technologies, J. R. Jacobson, ed., Proc. SPIE 652, 264-271 (1986).
    • (1986) Thin Film Technologies , vol.652 , pp. 264-271
    • Mattsson, L.1
  • 8
    • 18444410700 scopus 로고
    • A practical total integrated scatterometer
    • J. M. Bennett, Ed., Proc. SPIE
    • J. M. Guerra, “A practical total integrated scatterometer, ” in Surface Measurement and Characterization, J. M. Bennett, ed., Proc. SPIE 1009, 146-154 (1988).
    • (1988) Surface Measurement and Characterization , vol.1009 , pp. 146-154
    • Guerra, J.M.1
  • 9
    • 0028368633 scopus 로고
    • Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region
    • D. Ronnow and E. Veszelei, “Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region, ” Rev. Sci. Instrum. 65, 327-333 (1994).
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 327-333
    • Ronnow, D.1    Veszelei, E.2
  • 10
    • 84975655389 scopus 로고
    • Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques
    • R. D. Jacobson, S. R. Wilson, G. A. Al-Jumaily, J. R. McNeil, J. M. Bennett, and L. Mattsson, “Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques, ” Appl. Opt. 31, 1426-1435 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 1426-1435
    • Jacobson, R.D.1    Wilson, S.R.2    Al-Jumaily, G.A.3    McNeil, J.R.4    Bennett, J.M.5    Mattsson, L.6
  • 11
    • 0003753856 scopus 로고
    • Focusing properties of hemispherical and ellipsoidal mirror reflectometers
    • W. M. Brandenberg, “Focusing properties of hemispherical and ellipsoidal mirror reflectometers, ” J. Opt. Soc. Am. 54, 1235-1237 (1964).
    • (1964) J. Opt. Soc. Am. , vol.54 , pp. 1235-1237
    • Brandenberg, W.M.1
  • 12
    • 0001458859 scopus 로고    scopus 로고
    • Scanning scattering microscope for surface microtopography and defect imaging
    • J. Lorincik, D. Marton, R. L. King, and J. Fine, “Scanning scattering microscope for surface microtopography and defect imaging, ” J. Vac. Sci. Technol. B14, 2417-2423 (1996).
    • (1996) J. Vac. Sci. Technol. , vol.B14 , pp. 2417-2423
    • Lorincik, J.1    Marton, D.2    King, R.L.3    Fine, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.