Multi-class classifier-independent feature analysis

Pattern Recognition Letters

Volumn 18, Issue 11-13, 1997, Pages 1219-1224

  Holz, Hilary J ^a   Loew, Murray H ^a  

^a George Washington University   (United States)

Author keywords

Discriminatory power; Feature analysis; Feature selection; Ranking

Indexed keywords

CALCULATIONS; DATA STRUCTURES; FEATURE EXTRACTION; LEARNING SYSTEMS;

FEATURE ANALYSIS; FEATURE SELECTION;

PATTERN RECOGNITION;

EID: 0031277349     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(97)00118-9     Document Type: Article

References (5)

1. Fukunaga, K., Mantock, J.M., 1963. Nonparametric discriminant analysis. IEEE Trans. Pattern Anal. Machine Intell. 5, 671-678.
2. Holz, H.J., Loew, M.H., 1994a. Relative Feature Importance: A classifier-independent approach to feature selection. In: Gelsema, E.S., Kanal, L.N. (Eds.), Pattern Recognition in Practice IV. Elsevier, New York, pp. 473-487.
3. Holz, H.J., Loew, M.H., 1994b. Classifier-independent feature selection. In: Proc. 1994 IEEE Information Theory Workshop: Info. Theory and Statistics. IEEE Press, New York.
4. Holz, H.J., Loew, M.H., 1997. Sensitivity Analysis for RFI. Technical Report 2. Institute for Medical Imaging and Image Analysis, The George Washington University, Washington, DC.
5. Hughes, G.E., 1968. On the mean accuracy of statistical pattern recognizers. IEEE Trans. Inform. Theory 14, 55-63.