A standby current limited performance figure of merit for deep sub-micron CMOS

IEEE Transactions on Electron Devices

Volumn 44, Issue 11, 1997, Pages 1888-1895

  Chapman, Richard A ^a   Holloway, Thomas C ^a   McNeil, Vincent M ^a   Chatterjee, Amitava ^a   Stacey, George E ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CURRENTS; ELECTRIC INVERTERS; GATES (TRANSISTOR); NAND CIRCUITS;

ACTIVE CURRENT; DEEP SUBMICRON COMPLEMENTARY METAL OXIDE SUPERCONDUCTORS (CMOS); FIGURE OF MERIT (FOM); STANDBY CURRENT;

CMOS INTEGRATED CIRCUITS;

EID: 0031277334     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.641357     Document Type: Article

References (10)

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