A simple procedure for the assessment of plastic strain in electron back-scatter diffraction patterns

Scripta Materialia

Volumn 37, Issue 10, 1997, Pages 1511-1518

  Buchanan, P J ^a   Randle, V ^a   Flewitt, P E J ^b  

^a SWANSEA UNIVERSITY   (United Kingdom)

^b Berkeley Centre   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HARDNESS; MECHANICAL VARIABLES MEASUREMENT; STAINLESS STEEL; STRAIN; STRAIN MEASUREMENT; WELDS;

ELECTRON BACK SCATTER DIFFRACTION PATTERNS; MICROHARDNESS INDENT; PIXEL GREY LEVEL; PLASTIC STRAIN;

SCANNING ELECTRON MICROSCOPY;

EID: 0031277269     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(97)00245-5     Document Type: Article

References (6)

1. P.N. Quested, P.J. Henderson and M. McLean, Acta Met., 36 2743 (1988).
2. A.J. Wilkinson, Mat. Sci. Eng., A135, 189 (1991).
3. A.J. Wilkinson and D.J. Dingley, Acta Met. Mat., 40, 3357 (1992).
4. P.J. Buchanan, Research Masters Dissertation, University of Wales, (1966).
5. V. Randle, 'Microtexture determination and its applications', Institute of Materials, London, (1992).
6. V. Randle, D. Juul Jensen and N. Hansen, Phil. Mag. 73A, 265 (1996).