Quantitative interpretation of K-Edge NEXAFS data for various nickel hydroxides and the charged nickel electrode

Journal of Physical Chemistry B

Volumn 101, Issue 46, 1997, Pages 9441-9446

  Qian, X ^a   Sambe, H ^a   Ramaker, D E ^a,b   Pandya, K I ^c   O'Grady, W E ^b  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SOFTWARE; CRYSTAL ATOMIC STRUCTURE; NICKEL COMPOUNDS; OXIDATION; OXYGEN; SPECTRUM ANALYSIS;

NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS); NICKEL HYDROXIDE;

ELECTROCHEMICAL ELECTRODES;

EID: 0031276874     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp970435h     Document Type: Article

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