Nano-material processing with laser radiation in the near field of a scanning probe tip

Optics and Laser Technology

Volumn 29, Issue 8, 1998, Pages 433-437

  Jersch, J ^a   Demming, F ^a   Hildenhagen, J ^a   Dickmann, K ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

Nanoprocessing; Near field technology; Scanning probe technology

Indexed keywords

ELECTRIC INSULATORS; LASER BEAMS; METALS; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SURFACES;

NEAR FIELD TECHNOLOGY; SCANNING FORCE MICROSCOPY; SCANNING PROBE TECHNOLOGY;

NANOTECHNOLOGY;

EID: 0031276320     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0030-3992(97)00051-0     Document Type: Article

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