A revised model for carrier trapping-detrapping 1/f noise

Solid-State Electronics

Volumn 41, Issue 11, 1997, Pages 1811-1818

  Nemirovsky, Amikam ^a   Ron, Amiram ^b  

^a RAFAEL   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; OXIDES; SEMICONDUCTOR DEVICES; SOLID STATE PHYSICS; SPURIOUS SIGNAL NOISE;

ELECTRON TRAPPING AND DETRAPPING;

SOLID STATE DEVICES;

EID: 0031276192     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(97)00156-1     Document Type: Article

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