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Volumn 101, Issue 48, 1997, Pages 9901-9908

A combined EXAFS and diffraction study of pure and doped nanocrystalline tin oxide

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; CRYSTAL GROWTH; CRYSTAL LATTICES; DOPING (ADDITIVES); IRON; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL); SOL-GELS; SOLUTIONS; X RAY POWDER DIFFRACTION; X RAY SPECTROSCOPY;

EID: 0031276164     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971756w     Document Type: Article
Times cited : (79)

References (41)
  • 4
    • 4043107701 scopus 로고    scopus 로고
    • See, for example, papers in the special issue of: Chem. Mater. 1996, 8 (8).
    • (1996) Chem. Mater. , vol.8 , Issue.8
  • 9
    • 0001809571 scopus 로고
    • Moseley, P. T., Tofield, B. C. Eds.; Adam Hilger: Bristol, U.K.
    • Williams, D. E. In Solid State Gas Sensors; Moseley, P. T., Tofield, B. C. Eds.; Adam Hilger: Bristol, U.K., 1987; p 71.
    • (1987) Solid State Gas Sensors , pp. 71
    • Williams, D.E.1
  • 10
    • 4043110537 scopus 로고    scopus 로고
    • U.K. Patent Specification, 1280809, 1970
    • Taguchi, N. U.K. Patent Specification, 1280809, 1970.
    • Taguchi, N.1
  • 21
    • 0009431870 scopus 로고
    • Catlow, C. R. A., Greaves, G. N., Eds.; Blackie: Glasgow
    • Chadwick, A. V. In Applications of Synchrotron Radiation; Catlow, C. R. A., Greaves, G. N., Eds.; Blackie: Glasgow, 1993; p 171.
    • (1993) Applications of Synchrotron Radiation , pp. 171
    • Chadwick, A.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.