An integrated model for evaluating the amount of data required for reliable recognition

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 19, Issue 11, 1997, Pages 1251-1264

  Lindenbaum, Michael ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Localization; Noise models; Object recognition; Performance analysis; Pose estimation; Similarity measures

Indexed keywords

CLUTTER (INFORMATION THEORY); DATA ACQUISITION; DATA REDUCTION; DATA STRUCTURES; IMAGE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY;

POSE ESTIMATION;

OBJECT RECOGNITION;

EID: 0031276158     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.632984     Document Type: Article

References (18)

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