The effect of the microstructure on the static fatigue behaviour of Si3N4

Journal of Materials Science

Volumn 32, Issue 21, 1997, Pages 5775-5778

  Wang, Hongjie ^a   Wang, Yonglan ^a   Jin, Zhihao ^a   Zhou, Huijiu ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; CRYSTAL MICROSTRUCTURE; FATIGUE TESTING; FRACTURE TOUGHNESS; SERVICE LIFE; SINTERING; STRESS ANALYSIS;

STATIC FATIGUE;

SILICON NITRIDE;

EID: 0031275933     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1018678019734     Document Type: Article

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