Electron tunneling in structurally engineered proteins

Journal of Electroanalytical Chemistry

Volumn 438, Issue 1-2, 1997, Pages 43-47

  Gray, Harry B ^a   Winkler, Jay R ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Decay constant; Electron transfer rate; Electron tunneling; Proteins

Indexed keywords

CHARGE TRANSFER; CHEMICAL MODIFICATION; COPPER COMPOUNDS; ELECTRON TRANSITIONS; ELECTRON TUNNELING; METABOLISM; MOLECULAR STRUCTURE; NITROGEN FIXATION; ORGANOMETALLICS; PHOTOSYNTHESIS; REACTION KINETICS; RUTHENIUM COMPOUNDS;

DECAY CONSTANT; ELECTRON TRANSFER; ELECTRONIC COUPLING STRENGTH; SEMICLASSICAL THEORY;

PROTEINS;

EID: 0031275929     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(96)05024-3     Document Type: Article

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