The "realstruktur" of the system La2-xSrxCu1-yRuyO 4-δ studied by Rietveld and extended X-ray absorption fine structure spectroscopy

Journal of Physical Chemistry B

Volumn 101, Issue 48, 1997, Pages 9909-9915

  Ebbinghaus, Stefan ^a   Fröba, Michael ^a   Reller, Armin ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPUTATIONAL METHODS; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC STRUCTURE; LANTHANUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; RIETVELD REFINEMENT CALCULATIONS;

PEROVSKITE;

EID: 0031274869     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971551n     Document Type: Article

References (6)

1. Ebbinghaus, S.; Reller, A. Solid State Ionics 1997, in press.
2. Frahm, R. Instrum. Methods Phys. Res. 1988, A270, 578.
3. Ressler, T. J. Phys. IV (France) 1997, 7, C2-269.
4. Rehr, J. J.; Mustre de Leon, J.; Zabinsky, S. I.; Albers, R. C. J. Am. Chem. Soc. 1991, 113, 5135.
5. Young, R. A.; Sakthivel, A.; Moss, T. S.; Paiva-Santos, C. O. User's Guide to Program DBWS-9411 for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns; 1994.
6. Teo, B. K. EXAFS: Basic Principles and Data Analysis; Springer: Berlin, 1986; Chapter 2.