Characterization of alpha sources prepared by direct evaporation using Rutherford backscattering spectrometry

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 132, Issue 3, 1997, Pages 501-506

  Blanco Rodriguez P ^a   Martin Sanchez A ^a   Vera Tome F ^a   Ferrero Calabuig, J L ^b   Roldan Garcia C ^b   Juanes Barber, D ^b   Ager, F J ^c,d   Da Silva, M F ^c   Soares, J C ^c  

^a UNIVERSITY OF EXTREMADURA   (Spain)

^b UNIVERSITY OF VALENCIA   (Spain)

^c INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^d UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLE SPECTROMETERS; ALPHA PARTICLES; EVAPORATION; HELIUM; HYDROGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON SENSORS; SOLUTIONS; STAINLESS STEEL; THICKNESS MEASUREMENT;

ALPHA EMITTING NUCLIDES;

RADIOISOTOPES;

EID: 0031274608     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00457-6     Document Type: Article

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