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Volumn 15, Issue 6, 1997, Pages 1987-1989

Bias-temperature stability of the Cu(Mg)/SiO2/p-Si metal-oxide-semiconductor capacitors

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ANNEALING; COPPER; COPPER ALLOYS; DIFFUSION; ELECTRIC FIELD EFFECTS; MAGNESIUM; MOS DEVICES; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SILICA; THERMODYNAMIC STABILITY;

EID: 0031274562     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.