Barrier height of MIS-tunnel diode in presence of exponential distribution of deep level impurities

IETE Journal of Research

Volumn 43, Issue 6, 1997, Pages 411-414

  Sanyal, S ^a   Chattopadhyay, P ^a  

^a UNIVERSITY OF CALCUTTA   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC SPACE CHARGE; IMPURITIES; MIS DEVICES;

BARRIER HEIGHTS; EXPONENTIALLY DISTRIBUTED DEEP LEVEL IMPURITY;

TUNNEL DIODES;

EID: 0031274435     PISSN: 03772063     EISSN: 0974780X     Source Type: Journal    
DOI: 10.1080/03772063.1997.11416011     Document Type: Article

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