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Volumn 29, Issue 8, 1998, Pages 425-432

Evaluation of defects on an optical disc master plate

Author keywords

Digital image processing; Neural networks; Optical discs

Indexed keywords

AUTOMATION; DEFECTS; DIGITAL SIGNAL PROCESSING; IMAGE PROCESSING; MONITORING; NEURAL NETWORKS; PARTICLES (PARTICULATE MATTER); SURFACES;

EID: 0031274328     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0030-3992(97)00047-9     Document Type: Article
Times cited : (3)

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  • 2
    • 33744716846 scopus 로고    scopus 로고
    • Copper plate printing detection method and device there for, US Patent 4594514, (1986)
    • Sidler T., Gasser D., Copper plate printing detection method and device there for, US Patent 4594514, (1986)
    • Sidler, T.1    Gasser, D.2
  • 3
    • 33744710815 scopus 로고    scopus 로고
    • Method of manufacturing optical disc, US Patent 4957776, (1990)
    • Sanyo Electric Co., Method of manufacturing optical disc, US Patent 4957776, (1990)
  • 4
    • 0031098051 scopus 로고    scopus 로고
    • Digital image processing for evaluating the characteristics of the microstructure of a film
    • Sheng Lin, Chern, Chang, Rong-Seng Digital image processing for evaluating the characteristics of the microstructure of a film, Opt. Laser Technol., 29(2) (1997) 97-102
    • (1997) Opt. Laser Technol. , vol.29 , Issue.2 , pp. 97-102
    • Lin, S.1    Chern2    Chang3    Rong-Seng4
  • 5
    • 0028498297 scopus 로고
    • Volatile cleanroom contaminants: Sources and detection
    • September
    • Muller, A. J. Volatile cleanroom contaminants: sources and detection Solid State Technol. September (1994) 61-72
    • (1994) Solid State Technol. , pp. 61-72
    • Muller, A.J.1
  • 7
    • 0028460207 scopus 로고
    • Counting particles in high-pressure electronic specialty gases
    • Hwa-Chi, Wang Counting particles in high-pressure electronic specialty gases Solid State Technol. (1994) 97-107
    • (1994) Solid State Technol. , pp. 97-107
    • Hwa-Chi, W.1
  • 8
    • 0029377846 scopus 로고
    • Particle measurement in specialty gases
    • September
    • Hart, J. J. Particle measurement in specialty gases Solid State Technol. September (1995) 111-116
    • (1995) Solid State Technol. , pp. 111-116
    • Hart, J.J.1
  • 9
    • 33744606977 scopus 로고
    • Real-time single particle composition detection in liquids
    • October
    • Batchelder, J. S. Real-time single particle composition detection in liquids Solid State Technol. October (1992)
    • (1992) Solid State Technol.
    • Batchelder, J.S.1
  • 10
    • 0002956969 scopus 로고
    • Surface photovoltage monitoring of heavy metal contamination in IC manufacturing
    • December
    • Jastrzebski, L. Surface photovoltage monitoring of heavy metal contamination in IC manufacturing Solid State Technol. December (1992) 27-35
    • (1992) Solid State Technol. , pp. 27-35
    • Jastrzebski, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.