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Volumn 24, Issue 6, 1997, Pages 597-602

Numerical analysis of interfacial stress and stress singularity between thin films and substrates

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; BOUNDARY ELEMENT METHOD; CALCULATIONS; CERAMIC MATERIALS; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; SUBSTRATES; THIN FILMS;

EID: 0031274216     PISSN: 00936413     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0093-6413(97)00076-1     Document Type: Article
Times cited : (10)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.