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Volumn 24, Issue 6, 1997, Pages 597-602
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Numerical analysis of interfacial stress and stress singularity between thin films and substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
BOUNDARY CONDITIONS;
BOUNDARY ELEMENT METHOD;
CALCULATIONS;
CERAMIC MATERIALS;
FINITE ELEMENT METHOD;
INTERFACES (MATERIALS);
OXIDE SUPERCONDUCTORS;
SUBSTRATES;
THIN FILMS;
INTERFACIAL STRESS;
STRESS SINGULARITY;
SUPERCONDUCTING CERAMICS;
THERMAL STRESS;
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EID: 0031274216
PISSN: 00936413
EISSN: None
Source Type: Journal
DOI: 10.1016/s0093-6413(97)00076-1 Document Type: Article |
Times cited : (10)
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References (9)
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