The use of X-ray line profile analysis to investigate crystallite size and microstrain for zirconia powders

Journal of Materials Science

Volumn 32, Issue 21, 1997, Pages 5779-5790

  Lin, Jyung Dong ^a   Duh, Jenq Gong ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; PARTICLE SIZE ANALYSIS; POWDERS; STRAIN; X RAY ANALYSIS;

MICROSTRAIN; WARREN AVERDECH APPROACH; X RAY LINE PROFILE BROADENING ANALYSIS;

ZIRCONIA;

EID: 0031274155     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018630103804     Document Type: Article

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