Microcracks in chromium electrodeposits

Journal of Materials Science

Volumn 32, Issue 22, 1997, Pages 6069-6073

  Martyak, N M ^a   McCaskie, J E ^a   Voos, B ^b   Plieth, W ^b  

^a Atotech USA Inc   (United States)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSTS; ELECTRODEPOSITION; MICROCRACKS; RESIDUAL STRESSES; SULFUR COMPOUNDS; SURFACE STRUCTURE;

BENT CATHODE METHOD; SULFATE; TENSILE STRESSES;

CHROMIUM;

EID: 0031272259     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018639800595     Document Type: Article

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