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Volumn 32, Issue 22, 1997, Pages 6029-6038

TiN thin films deposited by filtered arc-evaporation: Structure, properties and applications

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CRYSTAL MICROSTRUCTURE; DEPOSITION; EVAPORATION; HARDNESS; LATTICE CONSTANTS; PLASMA APPLICATIONS; RESIDUAL STRESSES; THIN FILMS; TITANIUM COMPOUNDS; TOUGHNESS;

EID: 0031272258     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1018679414707     Document Type: Article
Times cited : (14)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.