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Volumn 32, Issue 22, 1997, Pages 6029-6038
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TiN thin films deposited by filtered arc-evaporation: Structure, properties and applications
a,d b c |
Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
CRYSTAL MICROSTRUCTURE;
DEPOSITION;
EVAPORATION;
HARDNESS;
LATTICE CONSTANTS;
PLASMA APPLICATIONS;
RESIDUAL STRESSES;
THIN FILMS;
TITANIUM COMPOUNDS;
TOUGHNESS;
FILTERED ARC EVAPORATION;
TITANIUM NITRIDE;
PROTECTIVE COATINGS;
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EID: 0031272258
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1018679414707 Document Type: Article |
Times cited : (14)
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References (29)
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