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Volumn 36, Issue 32, 1997, Pages 8370-8380

Software calibration of the multifringe pattern analysis of circular zone plates

Author keywords

Circular zone plate; Fringe pattern analysis; Image metrology; Image processing; Image understanding; Interferometry; Pattern recognition; Precision engineering

Indexed keywords

ALGORITHMS; CAMERAS; CHARGE COUPLED DEVICES; COMPUTER SOFTWARE; IMAGE UNDERSTANDING; INTERFEROMETRY; LASER BEAMS; MIRRORS; OPTIMIZATION; PATTERN RECOGNITION; PERTURBATION TECHNIQUES; PRECISION ENGINEERING;

EID: 0031271284     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008370     Document Type: Article
Times cited : (3)

References (13)
  • 2
    • 0022862521 scopus 로고
    • Automatic fringe pattern analysis: A review
    • G. T. Reid, “Automatic fringe pattern analysis: a review,” Opt. Lasers Eng. 7, 37-68 (1986-1987).
    • (1986) Opt. Lasers Eng , vol.7 , pp. 37-68
    • Reid, G.T.1
  • 5
    • 85010100278 scopus 로고    scopus 로고
    • Multi-fringe pattern analysis of circular zone plates
    • to be published
    • T. P. Hilaire and J. Pegna, “Multi-fringe pattern analysis of circular zone plates,” J. Electron. Imag. (to be published).
    • J. Electron. Imag
    • Hilaire, T.P.1    Pegna, J.2
  • 6
    • 0029422654 scopus 로고
    • Two-dimensional sub-micron in-terferometric translation straightness measurement for machine elements
    • American Society of Mechanical Engineers, Fairfield, N.J
    • T. P. Hilaire and J. Pegna, “Two-dimensional sub-micron in-terferometric translation straightness measurement for machine elements,” in Proceedings of the Symposium on Mechatronics for Manufacturing Metrology and Error Analysis 1995 (American Society of Mechanical Engineers, Fairfield, N.J., 1995), pp. 495-506.
    • (1995) Proceedings of the Symposium on Mechatronics for Manufacturing Metrology and Error Analysis , vol.1995 , pp. 495-506
    • Hilaire, T.P.1    Pegna, J.2
  • 8
    • 18444389095 scopus 로고    scopus 로고
    • Algorithmic circularity measurement for fringe analysis and sub-micron position sensing
    • F. Kimura, ed. (Chapman &Hall, London
    • J. Pegna, C. Guo, and T. P. Hilaire, “Algorithmic circularity measurement for fringe analysis and sub-micron position sensing,” in Computer Aided Tolerancing, F. Kimura, ed. (Chapman &Hall, London, 1996), pp. 283-297.
    • (1996) Computer Aided Tolerancing , pp. 283-297
    • Pegna, J.1    Guo, C.2    Hilaire, T.P.3
  • 12
    • 0020715751 scopus 로고
    • Comparison of interpolating methods for image resampling
    • J. A. Parker, R. V. Kenyon, and D. E. Troxel, “Comparison of interpolating methods for image resampling,” IEEE Trans. Med. Imaging 1, 31-39 (1983).
    • (1983) IEEE Trans. Med. Imaging , vol.1 , pp. 31-39
    • Parker, J.A.1    Kenyon, R.V.2    Troxel, D.E.3
  • 13
    • 0002834304 scopus 로고
    • Installation et utilisation du comparateur photo-electrique et interferentiel du Bureau International des Poids et Mesures
    • P. Carré, “Installation et utilisation du comparateur photo-electrique et interferentiel du Bureau International des Poids et Mesures,” Metrologia 2, 13-23 (1966).
    • (1966) Metrologia , vol.2 , pp. 13-23
    • Carré, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.