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Journal of Electroanalytical Chemistry

Volumn 437, Issue 1-2, 1997, Pages 119-124

Characterisation of the passive film on iron in phosphate medium by voltammetry and XPS measurements

(2) Benzakour, Jaouad a Derja, Ahmed a

a FACULTÉ DES SCIENCES SEMLALIA (Morocco)

Author keywords

Iron; Mott Schottky; Oxides; Passivation; Phosphate; Voltammetry; XPS

Indexed keywords

DISSOLUTION; ELECTRIC IMPEDANCE MEASUREMENT; ETCHING; FILM GROWTH; IRON OXIDES; PHOSPHATES; PRECIPITATION (CHEMICAL); SEMICONDUCTING FILMS; SEMICONDUCTOR DOPING; X RAY PHOTOELECTRON SPECTROSCOPY;

SPUTTER ETCHING;

PASSIVATION;

EID: 0031269215 PISSN: 15726657 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0728(97)00337-9 Document Type: Article

Times cited : (28)

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