Surface stability of MBE-grown Nd1.85Ce0.15CuO4 thin films in air investigated by RHEED, XPS, and UPS

Physica C: Superconductivity and its Applications

Volumn 291, Issue 1-2, 1997, Pages 67-72

  Yamamoto, H ^a   Naito, M ^a   Sato, H ^a  

^a NTT Basic Research Laboratories   (Japan)

Author keywords

MBE grown Nd1.85Ce0.15Cu04 film; RHEED; Surface stability; UPS; XPS

Indexed keywords

MOLECULAR BEAM EPITAXY; OXIDE SUPERCONDUCTORS; PHOTOEMISSION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STABILITY; SURFACE PROPERTIES; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOEMISSION SPECTROSCOPY; SURFACE STABILITY; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

SUPERCONDUCTING FILMS;

EID: 0031268438     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01674-2     Document Type: Article

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