Removal of thin layer for trace element analysis of solid surface in subnanometer scale using laser-ablation atomic fluorescence spectroscopy

Applied Physics Letters

Volumn 71, Issue 20, 1997, Pages 2916-2918

  Oki, Yuji ^a   Matsunaga, Kenji ^a   Nomura, Takumi ^a   Maeda, Mitsuo ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; ATOMIZATION; FLUORESCENCE; NANOTECHNOLOGY; OPTICAL GLASS; SCANNING ELECTRON MICROSCOPY; SODIUM; SURFACE TREATMENT; THIN FILMS; TRACE ANALYSIS; TRACE ELEMENTS;

LASER ABLATION ATOMIC FLUORESCENCE SPECTROSCOPY; SUBNANOMETER SCALE;

LASER ABLATION;

EID: 0031260805     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120215     Document Type: Article

References (5)

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