Testing or fault-finding for reliability growth: A missile destructive-test example

Naval Research Logistics

Volumn 44, Issue 7, 1997, Pages 623-637

  Gaver, D P ^a   Jacobs, P A ^a  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

Author keywords

Bayesian sequential analysis; Destructive testing; How much testing is enough; Operational testing; Poisson process; Reliability growth

Indexed keywords

EQUIPMENT TESTING; MARINE MISSILES; MATHEMATICAL MODELS; OPTIMIZATION; RELIABILITY;

BAYESIAN SEQUENTIAL ANALYSIS; DESTRUCTIVE TESTING; POISSON PROCESS; RELIABILITY GROWTH;

LOGISTICS;

EID: 0031258326     PISSN: 0894069X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6750(199710)44:7<623::AID-NAV2>3.0.CO;2-E     Document Type: Article

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