SCOPUS 정보 검색 플랫폼

Volumn 27, Issue 10, 1997, Pages 1179-1183

An improved electrochemical cell for the characterization of silicon/electrolyte interfaces

a IBM (France)

Author keywords

Semiconductor surface defects; Silicon surface characteristics; Silicon electrolyte interface; Surface potential measurements

Indexed keywords

ARGON; CHARGE TRANSFER; ELECTROLYTES; ELECTRONS; INTERFACES (MATERIALS); IONS; IRRADIATION; OXYGEN; SILICON WAFERS; SURFACE ROUGHNESS;

ELECTROCHEMICAL CELL; ELECTRON TRANSFER; SURFACE POTENTIAL MEASUREMENT;

ELECTROCHEMISTRY;

EID: 0031256931 PISSN: 0021891X EISSN: None Source Type: Journal
DOI: 10.1023/A:1018419600882 Document Type: Article

Times cited : (30)

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