High-resolution positron-annihilation-induced Auger electron spectrometer

Review of Scientific Instruments

Volumn 68, Issue 10, 1997, Pages 3893-3897

  Yang, S ^a,c   Zhou, H Q ^a,d   Jung, E ^a,e   Weiss, A H ^a   Citrin, P H ^b  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c NATIONAL SEMICONDUCTOR CORPORATION   (United States)

^d TEXAS INSTRUMENTS   (United States)

^e SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRON BEAMS; ELECTRON TRANSITIONS; GAMMA RAYS; GERMANIUM; IONIZATION; SURFACES;

CHANNEL ELECTRON MULTIPLIER; CYLINDRICAL MIRROR ANALYZER; POSITRON ANNIHILATION; POSITRON BOMBARDMENT;

AUGER ELECTRON SPECTROSCOPY;

EID: 0031256651     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148043     Document Type: Article

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