How do new process analyzers measure up?

Chemical Engineering Progress

Volumn 93, Issue 10, 1997, Pages 33-46

  Podkulski, Daniel E ^a  

^a CHEVRON PRODUCTS COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; NEURAL NETWORKS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PROCESSING; RAMAN SPECTROSCOPY; RELIABILITY; TECHNOLOGY;

NEAR INFRARED SPECTROSCOPY; PROCESS ANALYZERS;

PROCESS ENGINEERING;

EID: 0031256192     PISSN: 03607275     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

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