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Volumn 48, Issue 10-12, 1997, Pages 1649-1656
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Source-to-sample distance independent efficiency technique for XRF analysis
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CALCIUM;
FLUORESCENCE;
TITANIUM;
VANADIUM;
X RAY ANALYSIS;
ZIRCONIUM;
SOURCE TO SAMPLE DISTANCE INDEPENDENT EFFICIENCY TECHNIQUE;
X RAY FLUORESCENCE (XRF) ANALYSIS;
RADIATION DETECTORS;
CALCULATION;
COMPUTER PROGRAM;
CONFERENCE PAPER;
GEOMETRY;
PHOTON;
PRIORITY JOURNAL;
RADIATION DETECTION;
SCINTILLATION COUNTING;
SYSTEM ANALYSIS;
X RAY FLUORESCENCE;
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EID: 0031252142
PISSN: 09698043
EISSN: None
Source Type: Journal
DOI: 10.1016/S0969-8043(97)00165-6 Document Type: Conference Paper |
Times cited : (3)
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References (6)
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