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Volumn 19, Issue 7, 1997, Pages 455-458
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Comparative characterization of chemical vapor deposition diamond films by scanning cathodoluminescence microscopy
a a a a |
Author keywords
Backscattered electron contrast in SEM; Color cathodoluminescence; Color CL; CVD diamond films
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
DIAMOND FILMS;
EMISSION SPECTROSCOPY;
FILM GROWTH;
POLYCRYSTALLINE MATERIALS;
RAMAN SCATTERING;
BACKSCATTERED ELECTRON CONTRAST;
COLOR CATHODOLUMINESCENCE SCANNING ELECTRON MICROSCOPY;
PHOTOLUMINESCENCE SPECTROSCOPY;
PLASMA DISCHARGES;
SCANNING ELECTRON MICROSCOPY;
DIAMOND;
SILICON;
ARTICLE;
CHEMOLUMINESCENCE;
CRYSTAL STRUCTURE;
DIRECT CURRENT;
MICROWAVE RADIATION;
PRIORITY JOURNAL;
RAMAN SPECTROMETRY;
SCANNING ELECTRON MICROSCOPY;
VAPOR;
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EID: 0031251789
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950190701 Document Type: Article |
Times cited : (5)
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References (8)
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