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Volumn 94-95, Issue , 1997, Pages 242-246

The influence of the deposition angle on the composition of reactively sputtered thin films

Author keywords

Deposition angle; Film composition; Reactively sputtered thin films

Indexed keywords

COMPOSITION EFFECTS; COMPUTER SIMULATION; SPUTTER DEPOSITION; STOICHIOMETRY; SUBSTRATES; THIN FILMS;

EID: 0031250780     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00340-X     Document Type: Article
Times cited : (8)

References (8)
  • 1
    • 0000557901 scopus 로고
    • S.M. Rossnagel, J.J. Cuomo and W.D. Westwood (eds.), Noyes Publications, Park Ridge, New Jersey
    • W.D. Westwood, in S.M. Rossnagel, J.J. Cuomo and W.D. Westwood (eds.), Handbook of Plasma Processing Technology, Noyes Publications, Park Ridge, New Jersey, 1989, pp. 233-259.
    • (1989) Handbook of Plasma Processing Technology , pp. 233-259
    • Westwood, W.D.1
  • 8
    • 30244476074 scopus 로고    scopus 로고
    • presented at 43rd National Symposium, Philadelphia, PA, accepted for publication
    • D. Guerin and S.I. Shah, presented at 43rd National Symposium, Philadelphia, PA, 1996, accepted for publication in J. Vac. Sci. Technol. A.
    • (1996) J. Vac. Sci. Technol. A.
    • Guerin, D.1    Shah, S.I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.