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Volumn 180, Issue 3-4, 1997, Pages 487-496
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Pattern transition of temperature distribution at Czochralski silicon melt surface
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Author keywords
[No Author keywords available]
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Indexed keywords
COLOR IMAGE PROCESSING;
COMPUTER SIMULATION;
CRYSTAL GROWTH FROM MELT;
FLOW PATTERNS;
HEAT RADIATION;
TEMPERATURE DISTRIBUTION;
BLACKBODY CALIBRATION METHOD;
PATTERN TRANSITION;
TIME DEPENDENT SIMULATIONS;
SEMICONDUCTING SILICON;
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EID: 0031250752
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(97)00250-9 Document Type: Article |
Times cited : (39)
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References (16)
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