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Volumn 48, Issue 10, 1997, Pages 833-838

Profiling the residual stress and integral strain distribution in yttrium implanted titanium nitride

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC COATINGS; ION IMPLANTATION; RESIDUAL STRESSES; STRAIN; STRESS ANALYSIS; VACUUM APPLICATIONS; YTTRIUM;

EID: 0031250413     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(97)00034-1     Document Type: Article
Times cited : (2)

References (24)
  • 16
    • 0000951064 scopus 로고
    • Howard, S. A. and Snyder, R. L., Adv. X-ray Anal., 1983, 26, 73; J. Appl. Crystallogr., 1989, 22, 238, 244.
    • (1989) J. Appl. Crystallogr. , vol.22 , pp. 238
  • 18
    • 0001066804 scopus 로고
    • von Laue, M., Z. Kristallogr., 1926 64, 115; a discussion is given in: Wagner, C. N. J. and Aqua, E. N., Adv. X-ray Anal., 1978 7, 192.
    • (1926) Z. Kristallogr. , vol.64 , pp. 115
    • Von Laue, M.1
  • 19
    • 0039535210 scopus 로고
    • von Laue, M., Z. Kristallogr., 1926 64, 115; a discussion is given in: Wagner, C. N. J. and Aqua, E. N., Adv. X-ray Anal., 1978 7, 192.
    • (1978) Adv. X-ray Anal. , vol.7 , pp. 192
    • Wagner, C.N.J.1    Aqua, E.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.