Determination of transport parameters in fullerene films

Applied Physics Letters

Volumn 71, Issue 15, 1997, Pages 2160-2162

  Priebe, G ^a   Pietzak, B ^a   Konenkamp R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LEVELS; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; FULLERENES; LIGHT INTERFERENCE; OPTICAL VARIABLES MEASUREMENT; POLYCRYSTALLINE MATERIALS;

ELECTRON MOBILITY; ELECTRON SPIN RESONANCE SPIN SIGNAL; HOLE DRIFT MOBILITIES; OPTICAL INTERFERENCE GRATING; PHOTOCURRENT MEASUREMENT;

THIN FILMS;

EID: 0031250158     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119368     Document Type: Article

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