Corrosion studies of CVD diamond coated mplybdenum, evaluation of equivalent circuit and the effect of pinholes in diamond film on cyclic voltammetric behavior

Corrosion Science

Volumn 39, Issue 10-11, 1997, Pages 2019-2033

  Ramesham, R ^a   Rose, M F ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

AC impedance; B. cyclic voltammetry; Boron doped diamond; Microwave plasma; Tafel polarization

Indexed keywords

BORON; CHARGE TRANSFER; CHEMICAL VAPOR DEPOSITION; CORROSION RESISTANCE; DIAMOND FILMS; DOPING (ADDITIVES); ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; FILM GROWTH; MOLYBDENUM; PLASMAS; SODIUM CHLORIDE;

BORON DOPED DIAMOND; ELECTROCHEMICAL POLARIZATION MEASUREMENT; MICROWAVE PLASMA;

CYCLIC VOLTAMMETRY;

EID: 0031248912     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(97)00093-0     Document Type: Article

References (23)

1. J.E. Field, The Properties of Diamond. Academic Press, London, 1979.
2. P.M. Natishan and A. Morrish, Mater. Lett. 8, 269 (1989).
3. R. Ramesham, R.F. Askew, M.F. Rose and B.H. Loo, J. Electrochem. Soc. 140, 3018 (1993).
4. Yu.V. Pleskov, A. Ya Sakharova, M.D. Krotova, L.L. Bouilov and B.V. Spitsyn, J. Electroanal. Chem. 228, 19 (1987).
5. A. Ya Sakharova, Yu. Pleskov, F.Di. Quarto, S. Piazza, C. Sunseri, I.G. Teremetskaya and V.P. Varnin, J. Electrochemic. Soc. 142, 2704 (1995).
6. R. Tenne, K. Patel, K. Hashimoto and A. Fujishima, J. Electroanal. Chem. 347, 409 (1993).
7. C. Reuben, E. Galun, H. Cohen, R. Tenne, R. Kalish, Y. Muraki, K. Hashimoto, A. Fujishima, J.M. Butler and C. Levy-Clement, J. Electroanal. Chem. 396, 233 (1995).
8. G.M. Swain, J. Electrochem. Soc. 141, 3382 (1994).
9. B. Miller, R. Kalish, L.C. Feldman, A. Katz, N. Moriya, K. Short and A.E. White, J. Electrochem. Soc. 141, L41 (1994).
10. G.M. Swain and R. Ramesham, Anal. Chem. 65, 345 (1993).
11. H.B. Martin, A. Argoitia, U. Landau, A.B. Anderson and J.C. Angus, J. Electrochem. Soc. 143, L133 (1996).
12. S. Alehashem, F. Chambers, J. Strojek, G.M. Swain and R. Ramesham, Anal. Chem. 67, 2812 (1995).
13. J.Z. Zhu, S.Z. Yang, P.L. Zhu, X.K. Zhang, G.X. Zhang, C.F. Xu and H.C. Fan, Fresenuis J. Anal. Chem. 352, 389 (1995).
14. R. Ramesham and M.F. Rose, Diamond and Related Materials 6, 17 (1997).
15. Y.V. Pleskov, V. Ya Mishuk, M.A. Abturov, V.V. Elkin, M.D. Krotova, V.P. Varnin and I.G. Teremetskaya, J. Electroanal. Chem. 396, 227 (1995).
16. R. Ramesham, Thin Solid Films 229, 44 (1993).
17. R. Ramesham, M.F. Rose, R.F. Askew, T.L. Bekker, J.A. Dayton, Jr., I.L. Krainsky, G. Mearini, L. Vanzant, D.M. File, A.S. Gilmour, Jr. and V. Ayres, Surf. Coat. Technol. 64(2), 81-86 (1994).
18. R. Ramesham, T. Roppel, R.W. Johnson and J.M. Chang, Thin Solid Films 212, 96 (1992).
19. R. Ramesham and T. Roppel, J. Mater. Res. 7, 1144 (1992).
20. R. Ramesham, T. Roppel, C. Ellis and B.H. Loo, J. Electrochem. Soc. 138, 2981 (1991).
21. A.J. Bard and L.R. Faulkner, in Electrochemical Methods: Fundamentals and Applications. John Wiley and Sons, Inc., New York, 1980.
22. F. Mansfeld, M.W. Kendig and S. Tsai, Corrosion 38, 478 (1982).
23. W.J. Lorenz and F. Mansfeld, Corros. Sci. 21, 647 (1981).