An in-plane insensitive multiaperture speckle shear interferometer for slope measurement

Optics and Laser Technology

Volumn 29, Issue 7, 1997, Pages 415-417

  Sirohi, R S ^a,b   Krishna Mohan, N ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

Multi aperture speckle shear interferometry; Speckle metrology

Indexed keywords

ANGLE MEASUREMENT; HOLOGRAPHIC INTERFEROMETRY; IMAGING SYSTEMS; LIGHT INTERFERENCE; SPECKLE;

FRINGE PATTERNS; MULTIAPERTURE SPECKLE SHEAR INTERFEROMETRY; SLOPE MEASUREMENT; SPECKLE METROLOGY;

INTERFEROMETERS;

EID: 0031248775     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(97)00027-3     Document Type: Article

References (9)

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