Design for Test of Crystal Oscillators: A Case Study

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 11, Issue 2, 1997, Pages 109-117

  Santo Zarnik, Marina ^a,b,c   Novak, Franc ^b,c   Maček, Srečko ^b,c,d,e  

^a HIPOT HYB   (Slovenia)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c UNIVERSITY OF LJUBLJANA   (Slovenia)

^d Institute for Clinical Neurology   (Slovenia)

^e UNIVERSITÉ PARIS EST   (France)

Author keywords

Analog circuits; Crystal oscillators; Design for test; Fault diagnosis

Indexed keywords

INTEGRATED CIRCUITS; OSCILLATORS (ELECTRONIC);

ANALOG CIRCUITS; DESIGN-FOT TEST; FAULT DIAGNOSIS;

CRYSTAL OSCILLATORS;

EID: 0031248597     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008262204786     Document Type: Article

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