A new approach for the experimental circuit modeling of coupled interconnection structures based on causality

IEEE Transactions on Microwave Theory and Techniques

Volumn 45, Issue 10 PART 2, 1997, Pages 1977-1981

  Sercu, S ^a   Martens, L ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

Causality; Circuit modeling; Coupled interconnection structures

Indexed keywords

COMPUTER SIMULATION; CROSSTALK; FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; MEASUREMENTS; TIME DOMAIN ANALYSIS;

CAUSALITY;

INTERCONNECTION NETWORKS;

EID: 0031248524     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.641807     Document Type: Article

References (11)

1. A. J. Baden Fuller and A. M. Parker, "Computer optimization of circuits applied to the modeling of microwave 1C passive components," Proc. Inst. Elect. Eng., vol. 133, pt. H, pp. 411-118, Oct. 1986.
2. J. M. Jong and V. K. Tripathi, "Time-domain characterization of interconnect discontinuities in high-speed circuits," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 15, pp. 497-504, Aug. 1992.
3. A. K. Agrawal, K. M. Lee, L. D. Scott, and H. M. Fowles, "Experimental characterization of multiconductor transmission lines in the frequency domain," IEEE Trans. Electomagn. Compat., vol. EMC-21, pp. 20-27, Feb. 1979.
4. A. K. Agrawal, H. M. Fowles, and L. D. Scott, "Experimental characterization of multiconductor transmission lines in inhomogeneous media using time-domain techniques," IEEE Trans. Electomagn. Compat., vol. EMC-21, pp. 28-32, Feb. 1979.
5. J. M. Jong, B Janko, and V. K. Tripathi, "Equivalent circuit modeling of interconnects from time-domain measurements," IEEE Trans. Comp., Hybrids, Manufact. Technol., vol. 16, pp. 119-126, Feb. 1993.
6. J. C. Rautio, "Synthesis of lumped models from JV-port scattering parameter data," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 535-537, Mar. 1994.
7. L. A. Hayden and V. K. Tripathi, "Characterization and modeling of multiple line interconnections from time domain measurements," Trans. Microwave Theory Tech., vol. 42, pp. 1737-1743, Sept. 1994.
8. C. E. Abernethy, A. C. Cangellaris, and J. L. Prince, "A novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 19, pp. 32-39, Feb. 1996.
9. S. Sercu and L. Martens, "A new algorithm for experimental circuit modeling of interconnection structures based on causality," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 19, pp. 289-295, May 1996.
10. J. M. Jong, L. A. Hayden, and V. K. Tripathi, "Time domain measurements, characterization and modeling of interconnects," in 40th ARFTG Conf. Dig., Orlando, FL, Dec. 3-, 1992, pp. 96-103.
11. F. Olyslager, D. De Zutter, and K. Blomme, "Rigorous analysis of the propagation characteristics of general lossless and lossy multiconductor transmission lines in multilayered media," IEEE Trans. Microwave Theory Tech., vol. 41, pp. 79-88, Jan. 1993.