Electrical anisotropies in layer-structured lead bismuth titanate single crystals

Materials Research Bulletin

Volumn 32, Issue 10, 1997, Pages 1349-1357

  Yi, In Sook ^a   Miyayama, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

A. layered compounds; B. crystal growth; C. impedance spectroscopy; D. dielectric properties; D. electrical properties

Indexed keywords

ANISOTROPY; CAPACITANCE; CRYSTAL GROWTH; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE MEASUREMENT; FERROELECTRIC MATERIALS; PERMITTIVITY MEASUREMENT; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS;

CURIE TEMPERATURE; LEAD BISMUTH TITANATE; VERTICAL GRADIENT FREEZE METHOD;

LEAD COMPOUNDS;

EID: 0031248453     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(97)00111-6     Document Type: Article

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